Temperature dependence of electrical breakdown in polymer dielectrics

Cheolhong Min, Michael T. Lanagan, Thomas R. Shrout

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Polymer film capacitors have excellent high voltage performance and meet a majority of specifications for power electronic converters; however, high temperature degradation is a primary impediment to their use. Electrical breakdown of polypropylene and polyimide have been investigated over the temperature range from -3°C to 170°C. Breakdown measurements were carried out on at least 20 samples at incremental temperatures in order to determine the Weibull modulus and characteristic breakdown field. Breakdown strengths of polymers were found to decrease with increasing temperature. Dielectric properties and dielectric breakdown mechanisms were also studied.

Original languageEnglish (US)
Title of host publicationInternational Conference and Exhibition on High Temperature Electronics 2008, HiTEC 2008
Pages129-132
Number of pages4
StatePublished - Dec 1 2008
EventIMAPS High Temperature Electronics Conference, HiTEC 2008 - Albuquerque, NM, United States
Duration: May 12 2008May 15 2008

Publication series

NameInternational Conference and Exhibition on High Temperature Electronics 2008, HiTEC 2008

Other

OtherIMAPS High Temperature Electronics Conference, HiTEC 2008
CountryUnited States
CityAlbuquerque, NM
Period5/12/085/15/08

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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