Temperature dependence of optical wavelength shift as a validation technique for pulsed laser diode array thermal modeling

Jason Carter, David Snyder, Jerry Reichenbaugh

Research output: Contribution to journalConference articlepeer-review

8 Scopus citations

Abstract

As with any electronic device, the performance and reliability of laser diode arrays (LD.Vs) is a strong function of the temperature at which the array operates. However, the electrical and optical environment in which the LDA operates makes direct temperature measurements difficult. Wavelength measurements can be used as a means to deduce temperature by exploiting the linear relationship between wavelength and laser diode operating temperature. The process by which wavelength measurements are translated into temperature is discussed and experimental results using this methodology are shown. A wide range of information about both the transient and steady state thermal performance of LDA's can be acquired from such experimental measurements. These experimental results are compared with simulated numerical temperatures as a means to validate the simulation.

Original languageEnglish (US)
Pages (from-to)357-363
Number of pages7
JournalAnnual IEEE Semiconductor Thermal Measurement and Management Symposium
StatePublished - Jan 1 2003
EventNineteents Annual IEEE Semiconductor Thermal Measurement And Management Symposium - San Jose, CA, United States
Duration: Mar 11 2003Mar 13 2003

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering

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