Terahertz surface impedance of epitaxial MgB 2 thin film

B. B. Jin, P. Kuzel, F. Kadlec, T. Dahm, J. M. Redwing, A. V. Pogrebnyakov, X. X. Xi, N. Klein

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Abstract

We report on terahertz (THz) surface impedance measurement of an epitaxial Mg B2 thin film using time domain THz spectroscopy. We show that the surface resistance of the Mg B2 film is much lower than that of Y Ba2 Cu3 O7-δ and copper in the THz range. A linear dependence of the surface reactance on frequency is observed, yielding a penetration depth of about 100 nm at low temperatures. The measurements agree qualitatively with calculations based on impurity scattering in the Born limit. Our results clearly indicate that Mg B2 thin films have a great potential for THz electronic applications.

Original languageEnglish (US)
Article number092503
JournalApplied Physics Letters
Volume87
Issue number9
DOIs
StatePublished - Aug 29 2005

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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