Test generation and fault localization for quantum circuits

Marek Perkowski, Jacob Biamonte, Martin Lukac

Research output: Contribution to journalConference article

23 Citations (Scopus)

Abstract

It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.

Original languageEnglish (US)
Pages (from-to)62-68
Number of pages7
JournalProceedings of The International Symposium on Multiple-Valued Logic
StatePublished - Sep 20 2005
Event35th International Symposium on Multiple-Valued Logic, ISMVL 2005 - Calgary, Alta., Canada
Duration: May 19 2005May 21 2005

Fingerprint

Quantum Circuits
Test Generation
Fault
Networks (circuits)
Set Covering
Quantum Computing
Industry
Table
Internal
Generalise
Standards

All Science Journal Classification (ASJC) codes

  • Computer Science(all)
  • Mathematics(all)

Cite this

@article{352c75255b5442a4a5b5fb70f783993c,
title = "Test generation and fault localization for quantum circuits",
abstract = "It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. {"}Probabilistic set covering{"} and {"}probabilistic adaptive trees{"} that generalize those known in standard circuits, are next used.",
author = "Marek Perkowski and Jacob Biamonte and Martin Lukac",
year = "2005",
month = "9",
day = "20",
language = "English (US)",
pages = "62--68",
journal = "Proceedings of The International Symposium on Multiple-Valued Logic",
issn = "0195-623X",
publisher = "IEEE Computer Society",

}

Test generation and fault localization for quantum circuits. / Perkowski, Marek; Biamonte, Jacob; Lukac, Martin.

In: Proceedings of The International Symposium on Multiple-Valued Logic, 20.09.2005, p. 62-68.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Test generation and fault localization for quantum circuits

AU - Perkowski, Marek

AU - Biamonte, Jacob

AU - Lukac, Martin

PY - 2005/9/20

Y1 - 2005/9/20

N2 - It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.

AB - It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.

UR - http://www.scopus.com/inward/record.url?scp=24644492246&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=24644492246&partnerID=8YFLogxK

M3 - Conference article

SP - 62

EP - 68

JO - Proceedings of The International Symposium on Multiple-Valued Logic

JF - Proceedings of The International Symposium on Multiple-Valued Logic

SN - 0195-623X

ER -