Test of Supply Noise for Emerging Non-Volatile Memory

Mohammad Nasim Imtiaz Khan; Swaroop Ghosh

doi:10.1109/TEST.2018.8624896

Test of Supply Noise for Emerging Non-Volatile Memory

Mohammad Nasim Imtiaz Khan, Swaroop Ghosh

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Emerging Non-Volatile Memories (NVMs) suffer from high read/write current which can result in supply noise such as voltage droop and ground bounce. The magnitude of supply noise depends on the old data and the new data that is being written (for a write operation) or the stored data (for a read operation). In prior work, it has been shown that the noise generated by one access can affect another parallel access. Therefore, parallel read/write operation should be tested considering the supply noise. However, testing for read/write failure with supply noise considerations can take significant test time. In this work, we show that test time can be reduced by 410.82X for RRAM-based NVM Last Level Cache (LLC) by using Design for Test (DFT) circuits such as wordline overdrive and ending write operation early. We also show that the proposed test can save 79.875J of energy compared to the baseline test method.

Original language	English (US)
Title of host publication	International Test Conference 2018, ITC 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538683828
DOIs	https://doi.org/10.1109/TEST.2018.8624896
State	Published - Jan 23 2019
Event	49th IEEE International Test Conference, ITC 2018 - Phoenix, United States Duration: Oct 29 2018 → Nov 1 2018

Publication series

Name	Proceedings - International Test Conference
Volume	2018-October
ISSN (Print)	1089-3539

Conference

Conference	49th IEEE International Test Conference, ITC 2018
Country	United States
City	Phoenix
Period	10/29/18 → 11/1/18

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Applied Mathematics

Access to Document

10.1109/TEST.2018.8624896

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Khan, M. N. I., & Ghosh, S. (2019). Test of Supply Noise for Emerging Non-Volatile Memory. In International Test Conference 2018, ITC 2018 - Proceedings [8624896] (Proceedings - International Test Conference; Vol. 2018-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TEST.2018.8624896

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title = "Test of Supply Noise for Emerging Non-Volatile Memory",

abstract = "Emerging Non-Volatile Memories (NVMs) suffer from high read/write current which can result in supply noise such as voltage droop and ground bounce. The magnitude of supply noise depends on the old data and the new data that is being written (for a write operation) or the stored data (for a read operation). In prior work, it has been shown that the noise generated by one access can affect another parallel access. Therefore, parallel read/write operation should be tested considering the supply noise. However, testing for read/write failure with supply noise considerations can take significant test time. In this work, we show that test time can be reduced by 410.82X for RRAM-based NVM Last Level Cache (LLC) by using Design for Test (DFT) circuits such as wordline overdrive and ending write operation early. We also show that the proposed test can save 79.875J of energy compared to the baseline test method.",

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Khan, MNI & Ghosh, S 2019, Test of Supply Noise for Emerging Non-Volatile Memory. in International Test Conference 2018, ITC 2018 - Proceedings., 8624896, Proceedings - International Test Conference, vol. 2018-October, Institute of Electrical and Electronics Engineers Inc., 49th IEEE International Test Conference, ITC 2018, Phoenix, United States, 10/29/18. https://doi.org/10.1109/TEST.2018.8624896

Test of Supply Noise for Emerging Non-Volatile Memory. / Khan, Mohammad Nasim Imtiaz; Ghosh, Swaroop.

International Test Conference 2018, ITC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8624896 (Proceedings - International Test Conference; Vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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