Testing neutron-induced soft errors in semiconductor memory, invited

K. Ünlü, S. M. Çetiner, V. Degalahal, N. Vijaykrishnan, M. J. Irwin

Research output: Contribution to journalConference article

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)825-826
Number of pages2
JournalTransactions of the American Nuclear Society
Volume91
Publication statusPublished - Dec 1 2004
Event2004 Winter Meeting - American Nuclear Society - Washington, D.C., United States
Duration: Nov 14 2004Nov 18 2004

All Science Journal Classification (ASJC) codes

  • Nuclear Energy and Engineering
  • Industrial and Manufacturing Engineering
  • Energy Engineering and Power Technology

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