All Science Journal Classification (ASJC) codes
- Nuclear Energy and Engineering
- Industrial and Manufacturing Engineering
- Energy Engineering and Power Technology
Ünlü, K., Çetiner, S. M., Degalahal, V., Vijaykrishnan, N., & Irwin, M. J. (2004). Testing neutron-induced soft errors in semiconductor memory, invited. Transactions of the American Nuclear Society, 91, 825-826.