The axaf ccd imaging spectrometer

G. P. Garmire, David Nelson Burrows, C. Canizares, G. Clark, S. A. Sollins, Eric Feigelson, J. Morrison, John Andrew Nousek, S. H. Pravda, S. A. Rappaport, G. Ricker, G. R. Riegler, D. Weedmanl

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

The AXAF CCD Imaging Spectrometer (ACIS) is currently being defined as a possible focal plane instrument to be flown on the Advanced X -ray Astrophysics Facility (AXAF). The imaging spectrometer consists of an array of charge coupled devices (CCD’s) to be placed at the focus of the AXAF mirrors. The array will provide high angular resolution (~ 0.5 arc seconds), moderate spectral resolution (~ 150 eV) over the energy range 0.1 to 10 keV, temporal resolution down to ~ 60 μ sec, and single photon quantum detection efficiencies of up to 90 %. X -ray sensitivity for a point source exceeds 10-15 ergs /cm2 sec for a 105 sec exposure. When used in conjunction with the objective gratings, the array will yield wavelength resolution of up to λ/Δλ of about 200.

Original languageEnglish (US)
Pages (from-to)261-266
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume597
DOIs
StatePublished - Jul 14 1986

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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    Garmire, G. P., Burrows, D. N., Canizares, C., Clark, G., Sollins, S. A., Feigelson, E., Morrison, J., Nousek, J. A., Pravda, S. H., Rappaport, S. A., Ricker, G., Riegler, G. R., & Weedmanl, D. (1986). The axaf ccd imaging spectrometer. Proceedings of SPIE - The International Society for Optical Engineering, 597, 261-266. https://doi.org/10.1117/12.966590