The circular Bragg phenomenon for oblique incidence

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Structurally chiral materials exhibit the circular Bragg phenomenon (CBP). These materials preferentially reflect circularly polarized light of the same handedness while transmitting circularly polarized light of the opposite handedness within a range of wavelengths called the circular Bragg regime. The CBP has been extensively investigated experimentally for normal incidence, but not for oblique incidence. After fabricating a 20-periodthick chiral sculptured thin film, we measured all of its circular remittances over a 60° range of the angle of incidence and a 300-nm range of the free-space wavelength. Provided the incidence is not very oblique, the obtained dependencies of the center wavelength and the bandwidth of the CBP on the angle of incidence match theoretical estimates.

Original languageEnglish (US)
Title of host publicationPhotonic and Phononic Properties of Engineered Nanostructures V
EditorsAxel Scherer, Ali Adibi, Shawn-Yu Lin
PublisherSPIE
ISBN (Electronic)9781628414615
DOIs
StatePublished - Jan 1 2015
EventPhotonic and Phononic Properties of Engineered Nanostructures V - San Francisco, United States
Duration: Feb 9 2015Feb 12 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9371
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherPhotonic and Phononic Properties of Engineered Nanostructures V
CountryUnited States
CitySan Francisco
Period2/9/152/12/15

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Erten, S., Lakhtakia, A., & Barber, G. (2015). The circular Bragg phenomenon for oblique incidence. In A. Scherer, A. Adibi, & S-Y. Lin (Eds.), Photonic and Phononic Properties of Engineered Nanostructures V [93710J] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9371). SPIE. https://doi.org/10.1117/12.2084970