The impact of metallization thickness and geometry for X-band tunable microwave filters

Peter G. Lam, Zhiping Feng, Vrinda Haridasan, Angus I. Kingon, Michael B. Steer, Jon Paul Maria

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The impact of dc resistance on the performance of X-band filters with ferroelectric varactors was investigated. Two series of combline bandpass filters with specific geometries to isolate sources of conductor losses were designed and synthesized. Combining the changes in filter geometry with microwave measurements and planar filter solver (Sonnet software) simulations quantitatively identified the dependency of insertion loss on overall metallization thickness and local regions of thin metallization. The optimized 8-GHz bandpass filters exhibited insertion losses of 6.8 dB. These filters required 2.5 m of metal thickness (or 3 effective skin depths) to achieve this loss. The trend of loss with thickness indicates diminishing return with additional metal. The integration scheme requires thin regions of metal in the immediate vicinity of the varactors. It is shown through experiment and simulation that short distances (i.e., 15 m) of thin metallization can be tolerated provided that they are located in regions where the resonant microwave current is low.

Original languageEnglish (US)
Article number4976275
Pages (from-to)906-911
Number of pages6
JournalIEEE transactions on ultrasonics, ferroelectrics, and frequency control
Volume56
Issue number5
DOIs
StatePublished - May 1 2009

Fingerprint

microwave filters
Microwave filters
Metallizing
superhigh frequencies
Varactors
Insertion losses
Bandpass filters
filters
varactor diodes
Geometry
geometry
bandpass filters
Metals
insertion loss
Microwave measurement
metals
microwaves
Ferroelectric materials
Skin
low currents

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

Cite this

Lam, Peter G. ; Feng, Zhiping ; Haridasan, Vrinda ; Kingon, Angus I. ; Steer, Michael B. ; Maria, Jon Paul. / The impact of metallization thickness and geometry for X-band tunable microwave filters. In: IEEE transactions on ultrasonics, ferroelectrics, and frequency control. 2009 ; Vol. 56, No. 5. pp. 906-911.
@article{e7b932b7a1f140a4b9f4bdfa534af03a,
title = "The impact of metallization thickness and geometry for X-band tunable microwave filters",
abstract = "The impact of dc resistance on the performance of X-band filters with ferroelectric varactors was investigated. Two series of combline bandpass filters with specific geometries to isolate sources of conductor losses were designed and synthesized. Combining the changes in filter geometry with microwave measurements and planar filter solver (Sonnet software) simulations quantitatively identified the dependency of insertion loss on overall metallization thickness and local regions of thin metallization. The optimized 8-GHz bandpass filters exhibited insertion losses of 6.8 dB. These filters required 2.5 m of metal thickness (or 3 effective skin depths) to achieve this loss. The trend of loss with thickness indicates diminishing return with additional metal. The integration scheme requires thin regions of metal in the immediate vicinity of the varactors. It is shown through experiment and simulation that short distances (i.e., 15 m) of thin metallization can be tolerated provided that they are located in regions where the resonant microwave current is low.",
author = "Lam, {Peter G.} and Zhiping Feng and Vrinda Haridasan and Kingon, {Angus I.} and Steer, {Michael B.} and Maria, {Jon Paul}",
year = "2009",
month = "5",
day = "1",
doi = "10.1109/TUFFC.2009.1122",
language = "English (US)",
volume = "56",
pages = "906--911",
journal = "IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control",
issn = "0885-3010",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",

}

The impact of metallization thickness and geometry for X-band tunable microwave filters. / Lam, Peter G.; Feng, Zhiping; Haridasan, Vrinda; Kingon, Angus I.; Steer, Michael B.; Maria, Jon Paul.

In: IEEE transactions on ultrasonics, ferroelectrics, and frequency control, Vol. 56, No. 5, 4976275, 01.05.2009, p. 906-911.

Research output: Contribution to journalArticle

TY - JOUR

T1 - The impact of metallization thickness and geometry for X-band tunable microwave filters

AU - Lam, Peter G.

AU - Feng, Zhiping

AU - Haridasan, Vrinda

AU - Kingon, Angus I.

AU - Steer, Michael B.

AU - Maria, Jon Paul

PY - 2009/5/1

Y1 - 2009/5/1

N2 - The impact of dc resistance on the performance of X-band filters with ferroelectric varactors was investigated. Two series of combline bandpass filters with specific geometries to isolate sources of conductor losses were designed and synthesized. Combining the changes in filter geometry with microwave measurements and planar filter solver (Sonnet software) simulations quantitatively identified the dependency of insertion loss on overall metallization thickness and local regions of thin metallization. The optimized 8-GHz bandpass filters exhibited insertion losses of 6.8 dB. These filters required 2.5 m of metal thickness (or 3 effective skin depths) to achieve this loss. The trend of loss with thickness indicates diminishing return with additional metal. The integration scheme requires thin regions of metal in the immediate vicinity of the varactors. It is shown through experiment and simulation that short distances (i.e., 15 m) of thin metallization can be tolerated provided that they are located in regions where the resonant microwave current is low.

AB - The impact of dc resistance on the performance of X-band filters with ferroelectric varactors was investigated. Two series of combline bandpass filters with specific geometries to isolate sources of conductor losses were designed and synthesized. Combining the changes in filter geometry with microwave measurements and planar filter solver (Sonnet software) simulations quantitatively identified the dependency of insertion loss on overall metallization thickness and local regions of thin metallization. The optimized 8-GHz bandpass filters exhibited insertion losses of 6.8 dB. These filters required 2.5 m of metal thickness (or 3 effective skin depths) to achieve this loss. The trend of loss with thickness indicates diminishing return with additional metal. The integration scheme requires thin regions of metal in the immediate vicinity of the varactors. It is shown through experiment and simulation that short distances (i.e., 15 m) of thin metallization can be tolerated provided that they are located in regions where the resonant microwave current is low.

UR - http://www.scopus.com/inward/record.url?scp=67650497085&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=67650497085&partnerID=8YFLogxK

U2 - 10.1109/TUFFC.2009.1122

DO - 10.1109/TUFFC.2009.1122

M3 - Article

C2 - 19473908

AN - SCOPUS:67650497085

VL - 56

SP - 906

EP - 911

JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

SN - 0885-3010

IS - 5

M1 - 4976275

ER -