Cluster ion beam sources desorb molecules specifically from the top portion of the sample, making the approach useful for surface analysis; the primary ion beam can be focused to a submicrometer-sized spot where TOF detection can be used to obtain images of the surface. Nicholas Winograd at Pennsylvania State University describes the "magical" properties of cluster ion sources and considers the scope of new applications, particularly in bioimaging.
|Original language||English (US)|
|State||Published - Apr 1 2005|
All Science Journal Classification (ASJC) codes
- Analytical Chemistry