The noise performance of electron-multiplying charge-coupled devices at soft x-ray energy values

James H. Tutt, Andrew D. Holland, Neil J. Murray, David J. Hall, Richard D. Harriss, Andrew Clarke, Anthony M. Evagora

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

The use of electron-multiplying charge-coupled devices (CCDs) for high-resolution soft X-ray spectroscopy has been proposed in previous studies, and the analysis that followed experimentally identified and verified a modified Fano factor for X-ray detection using an 55Fe X-ray source. However, further experiments with soft X-rays at 1000 eV were less successful, attributed to excessive split events. More recently, through the use of deep-depletion e2v CCD220 and on-chip binning, it has been possible to greatly reduce the number of split events, allowing the result for the modified Fano factor at soft X-ray energy values to be verified. This paper looks at the earlier attempt to verify the modified Fano factor at 1000 eV with e2v CCD97 and shows the issues created by splitting of the charge cloud between pixels. It then compares these earlier results with new data collected using e2v CCD220, investigating how split-event reduction allows the modified Fano factor to be verified for low-energy X-rays.

Original languageEnglish (US)
Article number6221977
Pages (from-to)2192-2198
Number of pages7
JournalIEEE Transactions on Electron Devices
Volume59
Issue number8
DOIs
StatePublished - Jun 27 2012

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Charge coupled devices
X rays
Electrons
Factor X
X ray spectroscopy
Pixels
Experiments

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Tutt, J. H., Holland, A. D., Murray, N. J., Hall, D. J., Harriss, R. D., Clarke, A., & Evagora, A. M. (2012). The noise performance of electron-multiplying charge-coupled devices at soft x-ray energy values. IEEE Transactions on Electron Devices, 59(8), 2192-2198. [6221977]. https://doi.org/10.1109/TED.2012.2200488
Tutt, James H. ; Holland, Andrew D. ; Murray, Neil J. ; Hall, David J. ; Harriss, Richard D. ; Clarke, Andrew ; Evagora, Anthony M. / The noise performance of electron-multiplying charge-coupled devices at soft x-ray energy values. In: IEEE Transactions on Electron Devices. 2012 ; Vol. 59, No. 8. pp. 2192-2198.
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Tutt, JH, Holland, AD, Murray, NJ, Hall, DJ, Harriss, RD, Clarke, A & Evagora, AM 2012, 'The noise performance of electron-multiplying charge-coupled devices at soft x-ray energy values', IEEE Transactions on Electron Devices, vol. 59, no. 8, 6221977, pp. 2192-2198. https://doi.org/10.1109/TED.2012.2200488

The noise performance of electron-multiplying charge-coupled devices at soft x-ray energy values. / Tutt, James H.; Holland, Andrew D.; Murray, Neil J.; Hall, David J.; Harriss, Richard D.; Clarke, Andrew; Evagora, Anthony M.

In: IEEE Transactions on Electron Devices, Vol. 59, No. 8, 6221977, 27.06.2012, p. 2192-2198.

Research output: Contribution to journalArticle

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