The relation of electrical conductivity profiles and modulus data using the example of STO:Fe single crystals: A path to improve the model of resistance degradation

Thorsten J.M. Bayer, Jianjun Wang, Jared J. Carter, Ali Moballegh, Jonathon Baker, Douglas L. Irving, Elizabeth C. Dickey, Long-qing Chen, Clive A. Randall

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Resistance degradation in perovskites is characterized by an increase in current over time with applied electric field. This behavior can be simulated and spatially resolved conductivity profiles can be measured, but some inconsistencies remain. A new approach to address these problems is presented that utilizes time-resolved impedance spectroscopy with an applied DC voltage to provide new insight into the resistance degradation phenomenon. In particular, this method allows the in-situ acquisition of spatio-temporal variations in conductivity. In SrTiO3 a single bulk-dominated maximum of the imaginary part of the modulus M″ transitions to two maxima during degradation, reflecting the hole conductivity in the anode region and the electron conductivity in the cathode region. To clarify the influence of conductivity profiles on impedance data, the reversed route is presented by using simulated conductivity profiles to calculate impedance data. It will be emphasized that this methodology is not limited to the perovskite system considered here, but can be adapted to any kind of system characterized by a spatially varying conductivity.

Original languageEnglish (US)
Pages (from-to)252-261
Number of pages10
JournalActa Materialia
Volume117
DOIs
StatePublished - Sep 15 2016

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Single crystals
Degradation
Perovskite
Anodes
Cathodes
Electric fields
Spectroscopy
Electrons
Electric potential
Electric Conductivity
strontium titanium oxide
perovskite

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Bayer, Thorsten J.M. ; Wang, Jianjun ; Carter, Jared J. ; Moballegh, Ali ; Baker, Jonathon ; Irving, Douglas L. ; Dickey, Elizabeth C. ; Chen, Long-qing ; Randall, Clive A. / The relation of electrical conductivity profiles and modulus data using the example of STO:Fe single crystals : A path to improve the model of resistance degradation. In: Acta Materialia. 2016 ; Vol. 117. pp. 252-261.
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The relation of electrical conductivity profiles and modulus data using the example of STO:Fe single crystals : A path to improve the model of resistance degradation. / Bayer, Thorsten J.M.; Wang, Jianjun; Carter, Jared J.; Moballegh, Ali; Baker, Jonathon; Irving, Douglas L.; Dickey, Elizabeth C.; Chen, Long-qing; Randall, Clive A.

In: Acta Materialia, Vol. 117, 15.09.2016, p. 252-261.

Research output: Contribution to journalArticle

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AU - Bayer, Thorsten J.M.

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AU - Carter, Jared J.

AU - Moballegh, Ali

AU - Baker, Jonathon

AU - Irving, Douglas L.

AU - Dickey, Elizabeth C.

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AU - Randall, Clive A.

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