The substrate noise detector for noise tolerant mixed-signal IC

Byung Tae Kang, N. Vijaykrishnan, M. J. Irwin, I. D. Duarte

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A new type of substrate noise detector is proposed. It is embedded in a mixed-signal IC and monitors the level of substrate noise. Voltage comparators are used to detect errors and a counter tracks the number of errors periodically. From the number of errors, the level of substrate noise is estimated using the probabilistic approach. This type of detector is useful in that it monitors substrate noise in real-time. Using this, various adaptive algorithms become feasible to reduce substrate noise. The details of the detector circuits are presented.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE International SOC Conference, SOCC 2003
EditorsDong S. Ha, Richard Auletta, John Chickanosky
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages279-280
Number of pages2
ISBN (Electronic)0780381823, 9780780381827
DOIs
StatePublished - Jan 1 2003
EventIEEE International SOC Conference, SOCC 2003 - Portland, United States
Duration: Sep 17 2003Sep 20 2003

Publication series

NameProceedings - IEEE International SOC Conference, SOCC 2003

Other

OtherIEEE International SOC Conference, SOCC 2003
CountryUnited States
CityPortland
Period9/17/039/20/03

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Kang, B. T., Vijaykrishnan, N., Irwin, M. J., & Duarte, I. D. (2003). The substrate noise detector for noise tolerant mixed-signal IC. In D. S. Ha, R. Auletta, & J. Chickanosky (Eds.), Proceedings - IEEE International SOC Conference, SOCC 2003 (pp. 279-280). [1241520] (Proceedings - IEEE International SOC Conference, SOCC 2003). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SOC.2003.1241520