The use of EM-CCDs on high resolution soft x-ray spectrometers

James H. Tutt, Andrew D. Holland, Neil J. Murray, Richard D. Harriss, David J. Hall, Matt Soman, Randall L. McEntaffer, James Endicott

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Charge-Coupled Devices (CCDs) have been traditionally used on high resolution soft X-ray spectrometers, but with their ability to increase the signal level in the detector before the readout noise of the system is added, Electron-Multiplying CCDs (EM-CCDs) have the potential to offer many advantages in soft X-ray detection. Through this signal multiplication an EM-CCD has advantages over conventioanl CCDs of increased signal, suppressed noise, faster readout speeds for the same equivalent readout noise and an increased inmmunity to Electro-Magnetic Intereference. This paper will look at present and future spacel applications for high resolution soft X-ray spectrometers and assess the advantages and disadvantage of using EM-CCDs in these applications.

Original languageEnglish (US)
Title of host publicationUV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII
DOIs
StatePublished - 2011
EventUV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII - San Diego, CA, United States
Duration: Aug 21 2011Aug 24 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8145
ISSN (Print)0277-786X

Other

OtherUV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII
CountryUnited States
CitySan Diego, CA
Period8/21/118/24/11

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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