The use of reflectance data for in-season soybean yield prediction

Spyridon Mourtzinis, Scott C. Rowntree, Justin J. Suhre, Nicholas H. Weidenbenner, Eric W. Wilson, Vince M. Davis, Seth L. Naeve, Shaun N. Casteel, Brian W. Diers, Paul D. Esker, James E. Specht, Shawn P. Conley

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Agriculture & Biology