Theory of the X‐ray and optical properties of polysulphur nitride

W. I. Friesen, Daniel Bernard Litvin, B. Bergersen

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The extended Hückel method is used to calculate various band structure dependent properties of polysulphur nitride (SN)x. X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.

Original languageEnglish (US)
Pages (from-to)715-722
Number of pages8
Journalphysica status solidi (b)
Volume85
Issue number2
DOIs
StatePublished - Jan 1 1978

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Nitrides
Band structure
nitrides
Optical properties
optical properties
emission spectra

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

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abstract = "The extended H{\"u}ckel method is used to calculate various band structure dependent properties of polysulphur nitride (SN)x. X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.",
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Theory of the X‐ray and optical properties of polysulphur nitride. / Friesen, W. I.; Litvin, Daniel Bernard; Bergersen, B.

In: physica status solidi (b), Vol. 85, No. 2, 01.01.1978, p. 715-722.

Research output: Contribution to journalArticle

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AU - Litvin, Daniel Bernard

AU - Bergersen, B.

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