The extended Hückel method is used to calculate various band structure dependent properties of polysulphur nitride (SN)x. X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics