Thermal-aware floorplanning using genetic algorithms

W. L. Hung, Y. Xie, Vijaykrishnan Narayanan, C. Addo-Quaye, T. Theocharides, Mary Jane Irwin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

82 Scopus citations

Abstract

In this work, we present a genetic algorithm based thermal-aware floorplanning framework that aims at reducing hot spots and distributing temperature evenly across a chip while optimizing the traditional design metric, chip area. The floorplanning problem is formulated as a genetic algorithm problem, and a tool called HotSpot is used to calculate floorplanning temperature based on the power dissipation, the physical dimension, and the location of modules. Area and/or temperature optimizations guide the genetic algorithm to generate the final fittest solution. The experimental results using MCNC benchmarks and a face detection chip show that our combined area and thermal optimization technique decreases the peak temperature sufficiently while providing floorplans that are as compact as the traditional area-oriented techniques.

Original languageEnglish (US)
Title of host publicationProceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005
Pages634-639
Number of pages6
DOIs
StatePublished - Dec 1 2005
Event6th International Symposium on Quality Electronic Design, ISQED 2005 - San Jose, CA, United States
Duration: Mar 21 2005Mar 23 2005

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other6th International Symposium on Quality Electronic Design, ISQED 2005
CountryUnited States
CitySan Jose, CA
Period3/21/053/23/05

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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    Hung, W. L., Xie, Y., Narayanan, V., Addo-Quaye, C., Theocharides, T., & Irwin, M. J. (2005). Thermal-aware floorplanning using genetic algorithms. In Proceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005 (pp. 634-639). [1410656] (Proceedings - International Symposium on Quality Electronic Design, ISQED). https://doi.org/10.1109/ISQED.2005.122