Thick volume photorefractive(PR) crystal wavelength-multiplexed reflection-Type matched filter

F. T.S. Yu, S. Yin, Z. H. Yang

    Research output: Contribution to journalConference articlepeer-review

    1 Scopus citations

    Abstract

    In this paper, application of thick photorefractive(PR) crystal to wavelength-multiplexed reflectiontype matched filter is described. The Bragg diffraction limitation and the shift-invariant property using thick volume PR crystal are discussed, in which we see that the Bragg diffraction is severely limited by the thickness of the crystal. To alleviate the Bragg limitation in terms of shift tolerance, we have shown that the reflection-Type wavelength-multiplexed PR filter can be used. Experimental confirmation of these findings are also provided.

    Original languageEnglish (US)
    Pages (from-to)360-371
    Number of pages12
    JournalProceedings of SPIE - The International Society for Optical Engineering
    Volume2237
    DOIs
    StatePublished - Mar 1 1994
    EventOptical Pattern Recognition V 1994 - Orlando, United States
    Duration: Apr 4 1994Apr 8 1994

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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