The first-order reversal curves (FORC) distribution of PbZr0.52Ti0.48O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.
|Original language||English (US)|
|Number of pages||7|
|Journal||IEEE transactions on ultrasonics, ferroelectrics, and frequency control|
|State||Published - Aug 1 2010|
All Science Journal Classification (ASJC) codes
- Acoustics and Ultrasonics
- Electrical and Electronic Engineering