Thickness dependence of dielectric nonlinearity of lead zirconate titanate films

Ichiro Fujii, Eunki Hong, Susan Trolier-Mckinstry

Research output: Contribution to journalArticle

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Abstract

The first-order reversal curves (FORC) distribution of PbZr0.52Ti0.48O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.

Original languageEnglish (US)
Article number5529460
Pages (from-to)1717-1723
Number of pages7
JournalIEEE transactions on ultrasonics, ferroelectrics, and frequency control
Volume57
Issue number8
DOIs
StatePublished - Aug 1 2010

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All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

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