TY - JOUR
T1 - Thickness dependence of dielectric nonlinearity of lead zirconate titanate films
AU - Fujii, Ichiro
AU - Hong, Eunki
AU - Trolier-Mckinstry, Susan
N1 - Funding Information:
Manuscript received october 11, 2009; accepted april 14, 2010. This work was supported by the center for dielectric studies at the Pennsylvania state University and a national security science and Engineering Faculty Fellowship.
PY - 2010/8
Y1 - 2010/8
N2 - The first-order reversal curves (FORC) distribution of PbZr0.52Ti0.48O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.
AB - The first-order reversal curves (FORC) distribution of PbZr0.52Ti0.48O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.
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U2 - 10.1109/TUFFC.2010.1610
DO - 10.1109/TUFFC.2010.1610
M3 - Article
C2 - 20679003
AN - SCOPUS:77955385296
SN - 0885-3010
VL - 57
SP - 1717
EP - 1723
JO - IEEE Transactions on Sonics and Ultrasonics
JF - IEEE Transactions on Sonics and Ultrasonics
IS - 8
M1 - 5529460
ER -