Thickness dependence of the properties of epitaxial MgB2 thin films grown by hybrid physical-chemical vapor deposition

A. V. Pogrebnyakov, J. M. Redwing, J. E. Jones, X. X. Xi, S. Y. Xu, Qi Li, V. Vaithyanathan, D. G. Schlom

Research output: Contribution to journalArticle

99 Scopus citations

Abstract

An analysis of the thickness dependence of the properties of epitaxial MgB2 thin films grown by hybrid-chemical vapor deposition was presented. The film deposition rate was found to depend linearly on the concentration of B2H6. It was found that the superconducting and normal-state properties of the film were determined by the film thickness.

Original languageEnglish (US)
Pages (from-to)4319-4321
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number24
DOIs
Publication statusPublished - Jun 16 2003

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this