Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films

Zheng Li, Jiamian Hu, Li Shu, Ya Gao, Yang Shen, Yuanhua Lin, C. W. Nan

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Abstract

The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr 0.52Ti 0.48)O 3 (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films.

Original languageEnglish (US)
Article number033918
JournalJournal of Applied Physics
Volume111
Issue number3
DOIs
StatePublished - Feb 1 2012

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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    Li, Z., Hu, J., Shu, L., Gao, Y., Shen, Y., Lin, Y., & Nan, C. W. (2012). Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films. Journal of Applied Physics, 111(3), [033918]. https://doi.org/10.1063/1.3682764