Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films

Zheng Li, Jiamian Hu, Li Shu, Ya Gao, Yang Shen, Yuanhua Lin, C. W. Nan

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr 0.52Ti 0.48)O 3 (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films.

Original languageEnglish (US)
Article number033918
JournalJournal of Applied Physics
Volume111
Issue number3
DOIs
StatePublished - Feb 1 2012

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thin films
Kerr effects
alternating current
magnetization
electric potential

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Li, Z., Hu, J., Shu, L., Gao, Y., Shen, Y., Lin, Y., & Nan, C. W. (2012). Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films. Journal of Applied Physics, 111(3), [033918]. https://doi.org/10.1063/1.3682764
Li, Zheng ; Hu, Jiamian ; Shu, Li ; Gao, Ya ; Shen, Yang ; Lin, Yuanhua ; Nan, C. W. / Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films. In: Journal of Applied Physics. 2012 ; Vol. 111, No. 3.
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Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films. / Li, Zheng; Hu, Jiamian; Shu, Li; Gao, Ya; Shen, Yang; Lin, Yuanhua; Nan, C. W.

In: Journal of Applied Physics, Vol. 111, No. 3, 033918, 01.02.2012.

Research output: Contribution to journalArticle

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T1 - Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films

AU - Li, Zheng

AU - Hu, Jiamian

AU - Shu, Li

AU - Gao, Ya

AU - Shen, Yang

AU - Lin, Yuanhua

AU - Nan, C. W.

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AB - The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr 0.52Ti 0.48)O 3 (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films.

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