Thickness-dependent domain wall reorientation in 70/30 lead magnesium niobate- lead titanate thin films

Ryan Keech, Carl Morandi, Margeaux Wallace, Giovanni Esteves, Lyndsey Denis, Jonathon Guerrier, Raegan L. Johnson-Wilke, Chris M. Fancher, Jacob L. Jones, Susan Trolier-McKinstry

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Abstract

Continued reduction in length scales associated with many ferroelectric film-based technologies is contingent on retaining the functional properties as the film thickness is reduced. Epitaxial and polycrystalline lead magnesium niobate-lead titanate (70PMN-30PT) thin films were studied over the thickness range of 100-350 nm for the relative contributions to property thickness dependence from interfacial and grain-boundary low permittivity layers. Epitaxial PMN-PT films were grown on SrRuO3/(001)SrTiO3, while polycrystalline films with {001}-Lotgering factors >0.96 were grown on Pt/TiO2/SiO2/Si substrates via chemical solution deposition. Both film types exhibited similar relative permittivities of ~300 at high fields at all measured thicknesses with highly crystalline electrode/dielectric interfaces. These results, with the DC-biased and temperature-dependent dielectric characterization, suggest irreversible domain wall mobility is the major contributor to the overall dielectric response and its thickness dependence. In epitaxial films, the irreversible Rayleigh coefficients reduced 85% upon decreasing thickness from 350 to 100 nm. The temperature at which a peak in the relative permittivity is observed was the only measured small signal quantity which was more thickness-dependent in polycrystalline than epitaxial films. This is attributed to the relaxor nature present in the films, potentially stabilized by defect concentrations, and/or chemical inhomogeneity. Finally, the effective interfacial layers are found to contribute to the measured thickness dependence in the longitudinal piezoelectric coefficient.

Original languageEnglish (US)
Pages (from-to)3961-3972
Number of pages12
JournalJournal of the American Ceramic Society
Volume100
Issue number9
DOIs
StatePublished - Sep 2017

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All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Materials Chemistry

Cite this

Keech, R., Morandi, C., Wallace, M., Esteves, G., Denis, L., Guerrier, J., Johnson-Wilke, R. L., Fancher, C. M., Jones, J. L., & Trolier-McKinstry, S. (2017). Thickness-dependent domain wall reorientation in 70/30 lead magnesium niobate- lead titanate thin films. Journal of the American Ceramic Society, 100(9), 3961-3972. https://doi.org/10.1111/jace.14927