Thickness of thin films on glass - A round robin test

Volker Rupertus, Klaus Bange, Mark Farnworth, Patrice Lehuede, Paolo Mazzoldi, Alberto Vomiero, Nobuyuki Tadokoro, Satoshi Takeda, Carlo G. Pantano, Gianantonio Della Mea

Research output: Contribution to journalReview article

Abstract

The film thicknesses of five different layer systems on glass substrates were analyzed and determined in a multi-method approach by eight different university and industrial laboratories. The total coating thicknesses varied between a few nm up to some 100 nm. The measurements give information about the chemical composition and cover a wide spectrum of typical coating application on glasses. The results of the different laboratories and methods are compared and the challenges and limits of the various analytical techniques are discussed.

Original languageEnglish (US)
Pages (from-to)212-217
Number of pages6
JournalGlass Science and Technology
Volume78
Issue number5
StatePublished - Sep 1 2005

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites

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    Rupertus, V., Bange, K., Farnworth, M., Lehuede, P., Mazzoldi, P., Vomiero, A., Tadokoro, N., Takeda, S., Pantano, C. G., & Della Mea, G. (2005). Thickness of thin films on glass - A round robin test. Glass Science and Technology, 78(5), 212-217.