Thickness, strain, and temperature-dependent properties of barium strontium titanate thin films

Jon-Paul Maria, C. B. Parker, A. I. Kingon, G. Stauf

Research output: Contribution to conferencePaper

5 Citations (Scopus)

Abstract

Barium strontium titanate thin films prepared by MOCVD with Pt top and bottom electrodes have been investigated as a function of film thickness between 15 and 600 nm. Macroscopic temperature- and field-dependent electrical properties have been measured for the set of BST films with consistent composition and microstructure. All films are predominantly 001 oriented, have a fiber-textured microstructure, exhibit loss tangent values less than 0.01 (above Tmax), and have negligible dielectric dispersion between 103 and 106 Hz. With decreasing film thickness, the permittivity, the transition temperature, and the electrical tunability are reduced. This reduction in properties is accompanied by an increasingly diffuse ferroelectric transition. Using a lift-off process developed at NCSU the BST thin films (with bottom electrodes) have been removed from the substrates. After substrate removal, the films were characterized both electrically, i.e., the temperature dependence of the permittivity, and structurally, i.e., precision lattice constant measurements. These "substrateless" measurements were compared to the as deposited data, and the differences between the two data sets are believed to be related to the effects of residual strain. In general, with substrate removal, the permittivity values and transition temperatures increase. X-ray measurements reveal a release of approximately 0.1% strain in a direction parallel to the measurement axis (normal to the substrate). The electrical data and strain data are considered within the context of measurements and models for the behavior of ferroelectric crystals under the influence of an applied equi-biaxial stress.

Original languageEnglish (US)
Pages151-154
Number of pages4
StatePublished - Dec 1 2002
EventProceedings of the 13th IEEE International Symposium on Applications of Ferroelectronics - Nara, Japan
Duration: May 28 2002Jun 1 2002

Other

OtherProceedings of the 13th IEEE International Symposium on Applications of Ferroelectronics
CountryJapan
CityNara
Period5/28/026/1/02

Fingerprint

Barium strontium titanate
Permittivity
Thin films
Substrates
Superconducting transition temperature
Ferroelectric materials
Film thickness
Temperature
Microstructure
Electrodes
Metallorganic chemical vapor deposition
Lattice constants
Electric properties
X rays
Crystals
Fibers
Chemical analysis

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Maria, J-P., Parker, C. B., Kingon, A. I., & Stauf, G. (2002). Thickness, strain, and temperature-dependent properties of barium strontium titanate thin films. 151-154. Paper presented at Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectronics, Nara, Japan.
Maria, Jon-Paul ; Parker, C. B. ; Kingon, A. I. ; Stauf, G. / Thickness, strain, and temperature-dependent properties of barium strontium titanate thin films. Paper presented at Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectronics, Nara, Japan.4 p.
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abstract = "Barium strontium titanate thin films prepared by MOCVD with Pt top and bottom electrodes have been investigated as a function of film thickness between 15 and 600 nm. Macroscopic temperature- and field-dependent electrical properties have been measured for the set of BST films with consistent composition and microstructure. All films are predominantly 001 oriented, have a fiber-textured microstructure, exhibit loss tangent values less than 0.01 (above Tmax), and have negligible dielectric dispersion between 103 and 106 Hz. With decreasing film thickness, the permittivity, the transition temperature, and the electrical tunability are reduced. This reduction in properties is accompanied by an increasingly diffuse ferroelectric transition. Using a lift-off process developed at NCSU the BST thin films (with bottom electrodes) have been removed from the substrates. After substrate removal, the films were characterized both electrically, i.e., the temperature dependence of the permittivity, and structurally, i.e., precision lattice constant measurements. These {"}substrateless{"} measurements were compared to the as deposited data, and the differences between the two data sets are believed to be related to the effects of residual strain. In general, with substrate removal, the permittivity values and transition temperatures increase. X-ray measurements reveal a release of approximately 0.1{\%} strain in a direction parallel to the measurement axis (normal to the substrate). The electrical data and strain data are considered within the context of measurements and models for the behavior of ferroelectric crystals under the influence of an applied equi-biaxial stress.",
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Maria, J-P, Parker, CB, Kingon, AI & Stauf, G 2002, 'Thickness, strain, and temperature-dependent properties of barium strontium titanate thin films', Paper presented at Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectronics, Nara, Japan, 5/28/02 - 6/1/02 pp. 151-154.

Thickness, strain, and temperature-dependent properties of barium strontium titanate thin films. / Maria, Jon-Paul; Parker, C. B.; Kingon, A. I.; Stauf, G.

2002. 151-154 Paper presented at Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectronics, Nara, Japan.

Research output: Contribution to conferencePaper

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Maria J-P, Parker CB, Kingon AI, Stauf G. Thickness, strain, and temperature-dependent properties of barium strontium titanate thin films. 2002. Paper presented at Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectronics, Nara, Japan.