Time-of-flight static secondary ion mass spectrometry analysis of surface contamination on Pt/Ir standard mass material

Bibhash R. Chakraborty, Daniel E. Lehman, Nicholas Winograd

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to characterize surface contaminants on a Pt-10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non-oxygenated hydrocarbon adsorbates on the Pt-Ir surface provides a scenario for the increase in mass observed after standard cleaning procedures, and as a function of time. Static TOF-SIMS analysis suggests the catalytic activity of Pt plays a key role in the adsorption of organic solvents used in standard cleaning procedures as well as adsorption of hydrocarbon species present in ambient laboratory air.

Original languageEnglish (US)
Pages (from-to)1261-1265
Number of pages5
JournalRapid Communications in Mass Spectrometry
Volume12
Issue number18
DOIs
StatePublished - Jan 1 1998

Fingerprint

Secondary ion mass spectrometry
Contamination
Hydrocarbons
Cleaning
Adsorption
Adsorbates
Organic solvents
Catalyst activity
Impurities
Fabrication
Air

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry
  • Spectroscopy
  • Organic Chemistry

Cite this

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Time-of-flight static secondary ion mass spectrometry analysis of surface contamination on Pt/Ir standard mass material. / Chakraborty, Bibhash R.; Lehman, Daniel E.; Winograd, Nicholas.

In: Rapid Communications in Mass Spectrometry, Vol. 12, No. 18, 01.01.1998, p. 1261-1265.

Research output: Contribution to journalArticle

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