Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to characterize surface contaminants on a Pt-10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non-oxygenated hydrocarbon adsorbates on the Pt-Ir surface provides a scenario for the increase in mass observed after standard cleaning procedures, and as a function of time. Static TOF-SIMS analysis suggests the catalytic activity of Pt plays a key role in the adsorption of organic solvents used in standard cleaning procedures as well as adsorption of hydrocarbon species present in ambient laboratory air.
|Original language||English (US)|
|Number of pages||5|
|Journal||Rapid Communications in Mass Spectrometry|
|State||Published - Jan 1 1998|
All Science Journal Classification (ASJC) codes
- Analytical Chemistry
- Organic Chemistry