Time-Resolved Carrier Dynamics near the Insulator - Metal Transition

M. J. Feldstein, Christine Dolan Keating, W. Zheng, Y. H. Liau, A. G. MacDiarmid, Michael J. Natan, N. F. Scherer

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Carrier dynamics in polyaniline and colloidal Au films have been examined using a combined approach of time resolved laser spectroscopy and atomic force microscopy (AFM) These systems exhibit insulator-metal transitions (IMT) in conjunction with synthetic modification of their structure The relationship between structure and reactivity, in terms of hot carrier lifetimes and transport, has been identified by correlating changes in the dynamics with the directly measured morphology. Physical insight into the processes affecting carrier lifetimes and localization and the nature of the IMT has been derived from an analysis of the experimental data. The results and conclusions presented herein have implications for directing research and development in device applications based on thin film technologies.

Original languageEnglish (US)
Pages (from-to)141-151
Number of pages11
JournalACS Symposium Series
Volume679
StatePublished - Dec 1 1997

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Metal insulator transition
Carrier lifetime
Laser spectroscopy
Hot carriers
Carrier transport
Polyaniline
Atomic force microscopy
Thin films
polyaniline

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Chemical Engineering(all)

Cite this

Feldstein, M. J., Keating, C. D., Zheng, W., Liau, Y. H., MacDiarmid, A. G., Natan, M. J., & Scherer, N. F. (1997). Time-Resolved Carrier Dynamics near the Insulator - Metal Transition. ACS Symposium Series, 679, 141-151.
Feldstein, M. J. ; Keating, Christine Dolan ; Zheng, W. ; Liau, Y. H. ; MacDiarmid, A. G. ; Natan, Michael J. ; Scherer, N. F. / Time-Resolved Carrier Dynamics near the Insulator - Metal Transition. In: ACS Symposium Series. 1997 ; Vol. 679. pp. 141-151.
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Feldstein, MJ, Keating, CD, Zheng, W, Liau, YH, MacDiarmid, AG, Natan, MJ & Scherer, NF 1997, 'Time-Resolved Carrier Dynamics near the Insulator - Metal Transition', ACS Symposium Series, vol. 679, pp. 141-151.

Time-Resolved Carrier Dynamics near the Insulator - Metal Transition. / Feldstein, M. J.; Keating, Christine Dolan; Zheng, W.; Liau, Y. H.; MacDiarmid, A. G.; Natan, Michael J.; Scherer, N. F.

In: ACS Symposium Series, Vol. 679, 01.12.1997, p. 141-151.

Research output: Contribution to journalArticle

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AU - Feldstein, M. J.

AU - Keating, Christine Dolan

AU - Zheng, W.

AU - Liau, Y. H.

AU - MacDiarmid, A. G.

AU - Natan, Michael J.

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AB - Carrier dynamics in polyaniline and colloidal Au films have been examined using a combined approach of time resolved laser spectroscopy and atomic force microscopy (AFM) These systems exhibit insulator-metal transitions (IMT) in conjunction with synthetic modification of their structure The relationship between structure and reactivity, in terms of hot carrier lifetimes and transport, has been identified by correlating changes in the dynamics with the directly measured morphology. Physical insight into the processes affecting carrier lifetimes and localization and the nature of the IMT has been derived from an analysis of the experimental data. The results and conclusions presented herein have implications for directing research and development in device applications based on thin film technologies.

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Feldstein MJ, Keating CD, Zheng W, Liau YH, MacDiarmid AG, Natan MJ et al. Time-Resolved Carrier Dynamics near the Insulator - Metal Transition. ACS Symposium Series. 1997 Dec 1;679:141-151.