Toward a general methodology for specifying expert systems

Jonathan Lee, John Yen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A general methodology for specifying both the model and the process knowledge of an expert system at different abstraction levels is proposed. Specifications are acquired and organized around the general notion of a task. The model specification of a task describes a partial model of the application domain and a partial model of the problem solving states relevant to the task. The process specification of a task describes states before, during, and after the task as well as task state expression to describe the behavior. A piece of abstract specification can be refined to a more detailed specification. Specifications at different abstraction levels can be verified for their consistency and completeness.

Original languageEnglish (US)
Title of host publicationThird Int Conf Tools Artif Intell
PublisherPubl by IEEE
Pages260-263
Number of pages4
ISBN (Print)0818623004
StatePublished - Jan 1 1992
EventThird International Conference on Tools for Artificial Intelligence - San Jose, CA, USA
Duration: Nov 5 1991Nov 8 1991

Publication series

NameThird Int Conf Tools Artif Intell

Other

OtherThird International Conference on Tools for Artificial Intelligence
CitySan Jose, CA, USA
Period11/5/9111/8/91

Fingerprint

Expert systems
Specifications

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Lee, J., & Yen, J. (1992). Toward a general methodology for specifying expert systems. In Third Int Conf Tools Artif Intell (pp. 260-263). (Third Int Conf Tools Artif Intell). Publ by IEEE.
Lee, Jonathan ; Yen, John. / Toward a general methodology for specifying expert systems. Third Int Conf Tools Artif Intell. Publ by IEEE, 1992. pp. 260-263 (Third Int Conf Tools Artif Intell).
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Lee, J & Yen, J 1992, Toward a general methodology for specifying expert systems. in Third Int Conf Tools Artif Intell. Third Int Conf Tools Artif Intell, Publ by IEEE, pp. 260-263, Third International Conference on Tools for Artificial Intelligence, San Jose, CA, USA, 11/5/91.

Toward a general methodology for specifying expert systems. / Lee, Jonathan; Yen, John.

Third Int Conf Tools Artif Intell. Publ by IEEE, 1992. p. 260-263 (Third Int Conf Tools Artif Intell).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Lee J, Yen J. Toward a general methodology for specifying expert systems. In Third Int Conf Tools Artif Intell. Publ by IEEE. 1992. p. 260-263. (Third Int Conf Tools Artif Intell).