Toward classifying elementary microstructures in thin films by their scattering responses

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Abstract

The coupled dipole method (CDM) and the method of moments (MOM) can both be applied to study the light scattering responses of microstructures commnly found in optical and infrared thin films. A comparative analysis of the MOM and the CDM for these scattering problems is done. Three estimates of the polarizability scalars of subregional volumes are also compared.

Original languageEnglish (US)
Pages (from-to)869-886
Number of pages18
JournalInternational Journal of Infrared and Millimeter Waves
Volume13
Issue number6
DOIs
StatePublished - Jan 1 1992

All Science Journal Classification (ASJC) codes

  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Electrical and Electronic Engineering

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