Toward classifying elementary microstructures in thin films by their scattering responses

Research output: Contribution to journalComment/debate

Original languageEnglish (US)
Number of pages1
JournalInternational Journal of Infrared and Millimeter Waves
Volume14
Issue number3
DOIs
StatePublished - Mar 1 1993

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classifying
Scattering
Thin films
microstructure
Microstructure
thin films
scattering

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy (miscellaneous)
  • Electrical and Electronic Engineering

Cite this

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title = "Toward classifying elementary microstructures in thin films by their scattering responses",
author = "Akhlesh Lakhtakia",
year = "1993",
month = "3",
day = "1",
doi = "10.1007/BF02209272",
language = "English (US)",
volume = "14",
journal = "Journal of Infrared, Millimeter, and Terahertz Waves",
issn = "1866-6892",
publisher = "Springer New York",
number = "3",

}

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DO - 10.1007/BF02209272

M3 - Comment/debate

VL - 14

JO - Journal of Infrared, Millimeter, and Terahertz Waves

JF - Journal of Infrared, Millimeter, and Terahertz Waves

SN - 1866-6892

IS - 3

ER -