Toward increasing FPGA lifetime

Suresh Srinivasan, Ramakrishnan Krishnan, Prasanth Mangalagiri, Yuan Xie, Vijaykrishnan Narayanan, Mary Jane Irwin, Karthik Sarpatwari

Research output: Contribution to journalArticlepeer-review

62 Scopus citations

Abstract

Field-Programmable Gate Arrays (FPGAs) have been aggressively moving to lower gate length technologies. Such a scaling of technology has an adverse impact on the reliability of the underlying circuits in such architectures. Various different physical phenomena have been recently explored and demonstrated to impact the reliability of circuits in the form of both transient error susceptibility and permanent failures. In this work, we analyze the impact of two different types of hard errors, namely, Time-Dependent Dielectric Breakdown (TDDB) and Electromigration (EM) on FPGAs. We also study the performance degradation of FPGAs over time caused by Hot-Carrier Effects (HCE) and Negative Bias Temperature Instability (NBTI). Each study is performed on the components of FPGAs most affected by the respective phenomena, from both the performance and reliability perspective. Different solutions are demonstrated to counter each failure and degradation phenomena to increase the operating lifetime of the FPGAs.

Original languageEnglish (US)
Article number4384501
Pages (from-to)115-126
Number of pages12
JournalIEEE Transactions on Dependable and Secure Computing
Volume5
Issue number2
DOIs
StatePublished - 2008

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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