@inproceedings{7483613d11834c0b9b88477c78f034ee,
title = "TRACE ANALYSIS OF SOLID SURFACES BY COMBINATION OF ENERGETIC ION BOMBARDMENT AND MULTIPHOTON RESONANCE IONIZATION.",
abstract = "Recently, multiphoton resonance ionization (MPRI) has been coupled with energetic ion bombardment to yield a highly efficient and selective tool for solids analysis. Although this method promises to yield sub-ppb analysis for some materials, there are a number of experimental factors which will ultimately limit the analytical sensitivity of the technique. Among these factors are a) duty cycle, b) primary ion current, c) sputter yield, d) fraction of ejected particles which are ionizable, and e) detection efficiency. This paper discusses the origin of these factors and their influence on the use of MPRI for trace analysis of solids.",
author = "Kimock, {F. M.} and Baxter, {J. P.} and Kobrin, {P. H.} and Pappas, {D. L.} and Nicholas Winograd",
year = "1983",
month = dec,
day = "1",
language = "English (US)",
isbn = "0892524618",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "24--31",
editor = "Keller, {Richard A.}",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
address = "United States",
}