Energetic ion bombardment has been coupled with Multiphoton Resonance Ionization Spectroscopy to yield a powerful tool for surface analysis. This technique will be used to search for and examine the double-beta decay of Xe to Ba.
|Original language||English (US)|
|Title of host publication||Unknown Host Publication Title|
|Publisher||Optical Soc of America|
|Number of pages||1|
|State||Published - Dec 1 1987|
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