Abstract
Energetic ion bombardment has been coupled with Multiphoton Resonance Ionization Spectroscopy to yield a powerful tool for surface analysis. This technique will be used to search for and examine the double-beta decay of Xe to Ba.
Original language | English (US) |
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Title of host publication | Unknown Host Publication Title |
Publisher | Optical Soc of America |
Number of pages | 1 |
ISBN (Print) | 0936659386 |
State | Published - Dec 1 1987 |
All Science Journal Classification (ASJC) codes
- Engineering(all)