TRACE ANALYSIS OF SOLIDS USING MULTIPHOTON RESONANCE IONIZATION.

D. Pappas, D. Hrubowchok, L. Mitchell, N. Winograd

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Energetic ion bombardment has been coupled with Multiphoton Resonance Ionization Spectroscopy to yield a powerful tool for surface analysis. This technique will be used to search for and examine the double-beta decay of Xe to Ba.

Original languageEnglish (US)
Title of host publicationUnknown Host Publication Title
PublisherOptical Soc of America
Number of pages1
ISBN (Print)0936659386
StatePublished - Dec 1 1987

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Pappas, D., Hrubowchok, D., Mitchell, L., & Winograd, N. (1987). TRACE ANALYSIS OF SOLIDS USING MULTIPHOTON RESONANCE IONIZATION. In Unknown Host Publication Title Optical Soc of America.