Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure

J. S. Luo, S. E. Dorris, M. T. Lanagan, V. A. Maroni

Research output: Contribution to conferencePaper

Abstract

Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.

Original languageEnglish (US)
Pages798-799
Number of pages2
StatePublished - Dec 1 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Luo, J. S., Dorris, S. E., Lanagan, M. T., & Maroni, V. A. (1994). Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure. 798-799. Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, .