Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure

J. S. Luo, S. E. Dorris, M. T. Lanagan, V. A. Maroni

Research output: Contribution to conferencePaper

Abstract

Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.

Original languageEnglish (US)
Pages798-799
Number of pages2
StatePublished - Dec 1 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

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Critical currents
Lead
Transmission electron microscopy
Powders
Microstructure
Composite materials
Brick
Superconducting materials
Aspect ratio
Grain boundaries
Electric properties
Chemical analysis
X-Ray Emission Spectrometry

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Luo, J. S., Dorris, S. E., Lanagan, M. T., & Maroni, V. A. (1994). Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure. 798-799. Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, .
Luo, J. S. ; Dorris, S. E. ; Lanagan, M. T. ; Maroni, V. A. / Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process : The effect of lead addition on critical current and microstructure. Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, .2 p.
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abstract = "Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.",
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year = "1994",
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Luo, JS, Dorris, SE, Lanagan, MT & Maroni, VA 1994, 'Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure', Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, 7/31/94 - 8/5/94 pp. 798-799.

Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process : The effect of lead addition on critical current and microstructure. / Luo, J. S.; Dorris, S. E.; Lanagan, M. T.; Maroni, V. A.

1994. 798-799 Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, .

Research output: Contribution to conferencePaper

TY - CONF

T1 - Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process

T2 - The effect of lead addition on critical current and microstructure

AU - Luo, J. S.

AU - Dorris, S. E.

AU - Lanagan, M. T.

AU - Maroni, V. A.

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N2 - Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.

AB - Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.

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Luo JS, Dorris SE, Lanagan MT, Maroni VA. Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure. 1994. Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, .