Transmission electron microscopy study of la-doped bi-sr-cu-0 compound

Bin Lu, Fang Hua Li, Hong Chen, Wei Liu, Zhiqiang Mao, Yu Heng Zhang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A La-doped Bi-Sr-Cu-0 phase is studied by electron diffraction and high-resolution electron microscopy. The space group of the crystal is Ccca and the lattice parameters are a = 5.39 Å-23.5 Å, and c = 34.0 Å. The structural difference between the present compound and the ESrsCusO phase is discussed. The origin of high temperature superconductivity in this sample is proposed.

Original languageEnglish (US)
Pages (from-to)L425-L428
JournalJapanese Journal of Applied Physics
Volume34
Issue number4
DOIs
StatePublished - Jan 1 1995

Fingerprint

High resolution electron microscopy
Superconductivity
Electron diffraction
Lattice constants
lattice parameters
electron microscopy
superconductivity
electron diffraction
Transmission electron microscopy
transmission electron microscopy
Crystals
high resolution
crystals
Temperature

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Lu, Bin ; Li, Fang Hua ; Chen, Hong ; Liu, Wei ; Mao, Zhiqiang ; Zhang, Yu Heng. / Transmission electron microscopy study of la-doped bi-sr-cu-0 compound. In: Japanese Journal of Applied Physics. 1995 ; Vol. 34, No. 4. pp. L425-L428.
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Transmission electron microscopy study of la-doped bi-sr-cu-0 compound. / Lu, Bin; Li, Fang Hua; Chen, Hong; Liu, Wei; Mao, Zhiqiang; Zhang, Yu Heng.

In: Japanese Journal of Applied Physics, Vol. 34, No. 4, 01.01.1995, p. L425-L428.

Research output: Contribution to journalArticle

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T1 - Transmission electron microscopy study of la-doped bi-sr-cu-0 compound

AU - Lu, Bin

AU - Li, Fang Hua

AU - Chen, Hong

AU - Liu, Wei

AU - Mao, Zhiqiang

AU - Zhang, Yu Heng

PY - 1995/1/1

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