Transport critical current density and microstructure in extruded YBa 2 Cu 3 O 7-x wires processed by zone melting

Donglu Shi, H. Krishnan, J. M. Hong, D. Miller, P. J. McGinn, W. H. Chen, Ming Xu, J. G. Chen, M. M. Fang, U. Welp, Michael T. Lanagan, K. C. Goretta, J. T. Dusek, J. J. Picciolo, U. Balachandran

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

YBa 2 Cu 3 O 7-x compounds were extruded into long wires with the diameter of 1 mm after sintering. The sintered wires were subsequently zone melted to develop a highly textured microstructure. Magnetization experiments at 77 K indicated a J c value of 1×10 5 A/cm 2 at 1 T. Transport measurements at 77 K showed a greatly enhanced field dependence of the critical current density. Transmission electron microscopy revealed an important grain-boundary feature which eliminated the weak-link behavior. Large amounts of dislocations have also been found in the zone-melted sample which may contribute to flux pinning in the system.

Original languageEnglish (US)
Pages (from-to)228-232
Number of pages5
JournalJournal of Applied Physics
Volume68
Issue number1
DOIs
StatePublished - Dec 1 1990

Fingerprint

zone melting
critical current
wire
current density
microstructure
flux pinning
sintering
grain boundaries
magnetization
transmission electron microscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Shi, D., Krishnan, H., Hong, J. M., Miller, D., McGinn, P. J., Chen, W. H., ... Balachandran, U. (1990). Transport critical current density and microstructure in extruded YBa 2 Cu 3 O 7-x wires processed by zone melting Journal of Applied Physics, 68(1), 228-232. https://doi.org/10.1063/1.347122
Shi, Donglu ; Krishnan, H. ; Hong, J. M. ; Miller, D. ; McGinn, P. J. ; Chen, W. H. ; Xu, Ming ; Chen, J. G. ; Fang, M. M. ; Welp, U. ; Lanagan, Michael T. ; Goretta, K. C. ; Dusek, J. T. ; Picciolo, J. J. ; Balachandran, U. / Transport critical current density and microstructure in extruded YBa 2 Cu 3 O 7-x wires processed by zone melting In: Journal of Applied Physics. 1990 ; Vol. 68, No. 1. pp. 228-232.
@article{0627df9cd8734478a5551335ed698967,
title = "Transport critical current density and microstructure in extruded YBa 2 Cu 3 O 7-x wires processed by zone melting",
abstract = "YBa 2 Cu 3 O 7-x compounds were extruded into long wires with the diameter of 1 mm after sintering. The sintered wires were subsequently zone melted to develop a highly textured microstructure. Magnetization experiments at 77 K indicated a J c value of 1×10 5 A/cm 2 at 1 T. Transport measurements at 77 K showed a greatly enhanced field dependence of the critical current density. Transmission electron microscopy revealed an important grain-boundary feature which eliminated the weak-link behavior. Large amounts of dislocations have also been found in the zone-melted sample which may contribute to flux pinning in the system.",
author = "Donglu Shi and H. Krishnan and Hong, {J. M.} and D. Miller and McGinn, {P. J.} and Chen, {W. H.} and Ming Xu and Chen, {J. G.} and Fang, {M. M.} and U. Welp and Lanagan, {Michael T.} and Goretta, {K. C.} and Dusek, {J. T.} and Picciolo, {J. J.} and U. Balachandran",
year = "1990",
month = "12",
day = "1",
doi = "10.1063/1.347122",
language = "English (US)",
volume = "68",
pages = "228--232",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "1",

}

Shi, D, Krishnan, H, Hong, JM, Miller, D, McGinn, PJ, Chen, WH, Xu, M, Chen, JG, Fang, MM, Welp, U, Lanagan, MT, Goretta, KC, Dusek, JT, Picciolo, JJ & Balachandran, U 1990, ' Transport critical current density and microstructure in extruded YBa 2 Cu 3 O 7-x wires processed by zone melting ', Journal of Applied Physics, vol. 68, no. 1, pp. 228-232. https://doi.org/10.1063/1.347122

Transport critical current density and microstructure in extruded YBa 2 Cu 3 O 7-x wires processed by zone melting . / Shi, Donglu; Krishnan, H.; Hong, J. M.; Miller, D.; McGinn, P. J.; Chen, W. H.; Xu, Ming; Chen, J. G.; Fang, M. M.; Welp, U.; Lanagan, Michael T.; Goretta, K. C.; Dusek, J. T.; Picciolo, J. J.; Balachandran, U.

In: Journal of Applied Physics, Vol. 68, No. 1, 01.12.1990, p. 228-232.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Transport critical current density and microstructure in extruded YBa 2 Cu 3 O 7-x wires processed by zone melting

AU - Shi, Donglu

AU - Krishnan, H.

AU - Hong, J. M.

AU - Miller, D.

AU - McGinn, P. J.

AU - Chen, W. H.

AU - Xu, Ming

AU - Chen, J. G.

AU - Fang, M. M.

AU - Welp, U.

AU - Lanagan, Michael T.

AU - Goretta, K. C.

AU - Dusek, J. T.

AU - Picciolo, J. J.

AU - Balachandran, U.

PY - 1990/12/1

Y1 - 1990/12/1

N2 - YBa 2 Cu 3 O 7-x compounds were extruded into long wires with the diameter of 1 mm after sintering. The sintered wires were subsequently zone melted to develop a highly textured microstructure. Magnetization experiments at 77 K indicated a J c value of 1×10 5 A/cm 2 at 1 T. Transport measurements at 77 K showed a greatly enhanced field dependence of the critical current density. Transmission electron microscopy revealed an important grain-boundary feature which eliminated the weak-link behavior. Large amounts of dislocations have also been found in the zone-melted sample which may contribute to flux pinning in the system.

AB - YBa 2 Cu 3 O 7-x compounds were extruded into long wires with the diameter of 1 mm after sintering. The sintered wires were subsequently zone melted to develop a highly textured microstructure. Magnetization experiments at 77 K indicated a J c value of 1×10 5 A/cm 2 at 1 T. Transport measurements at 77 K showed a greatly enhanced field dependence of the critical current density. Transmission electron microscopy revealed an important grain-boundary feature which eliminated the weak-link behavior. Large amounts of dislocations have also been found in the zone-melted sample which may contribute to flux pinning in the system.

UR - http://www.scopus.com/inward/record.url?scp=36549095408&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=36549095408&partnerID=8YFLogxK

U2 - 10.1063/1.347122

DO - 10.1063/1.347122

M3 - Article

VL - 68

SP - 228

EP - 232

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 1

ER -