Transport mechanism

Mao Zhiqiang, Xu Gaojie, Yan Hongjie, Wang Bin, Qiu Xueyin, Zhang Yuheng

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Abstract

The transport properties of the (Formula presented) solid solution series have been investigated by means of electric resistivity and thermoelectric power (TEP). The TEP measurements reveal that the Ni doping at the Cu site brings about an anomalous change in the TEP. The TEP value (Formula presented) increases with increasing Ni content for the samples with low dopant levels (Formula presented) and reaches a maximum at (Formula presented) but decreases rapidly with the further increase of Ni content for (Formula presented) and becomes negative at (Formula presented) The resistivity measurements show that the character of the conductivity for the samples with (Formula presented) changes from thermally activated at high temperature to hoppinglike at low temperature. By the comparison of the thermal activation energy derived from the resistivity with that from the TEP, we find that the transport mechanism in (Formula presented) can be understood in terms of the polaron model.

Original languageEnglish (US)
Pages (from-to)15116-15119
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume58
Issue number22
DOIs
StatePublished - Jan 1 1998

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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