Trapping site geometry of N2H4+ radical ion in x-irradiated single crystals of N2H5HC 2O4: An ENDOR study

E. Sagstuen, O. Awadelkarim, A. Lund, J. Masiakowski

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

The radical ion N2H4+ has been produced by x irradiating single crystals of hydrazinium hydrogen oxalate (N 2H5HC2O4) and studied by ESR and ENDOR spectroscopy. The structure of the trapping site has been elucidated by observing 1H ENDOR transitions not only from the radical but also from distant protons. One of the latter originates from the proton lost by N2H5+ upon radical formation. Evidence that proton transfer occurs through a hydrogen bond is presented.

Original languageEnglish (US)
Pages (from-to)3223-3228
Number of pages6
JournalThe Journal of chemical physics
Volume85
Issue number6
DOIs
StatePublished - 1986

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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