Truncation of angular spread of Bragg zones by total reflection, and Goos-Hänchen shifts exhibited by chiral sculptured thin films

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Abstract

The total-reflection phenomenon is shown to restrict the angular spread of the Bragg phenomenon, when a plane wave is incident on a chiral sculptured thin film (STF) from an optically denser medium. Unlike the Bragg phenomenon, the total-reflection phenomenon is insensitive to the structural handedness of the chiral STF. Mechanically tunable Goos-Hänchen shifts that are appreciable fractions of the wavelength are experienced by beams of finite transverse extent, in the total-reflection regime.

Original languageEnglish (US)
Pages (from-to)169-176
Number of pages8
JournalAEU-Archiv fur Elektronik und Ubertragungstechnik
Volume56
Issue number3
StatePublished - Jun 8 2002

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Thin films
Wavelength

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

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