Tungsten-oxide thin films of dense, columnar, and chiral morphologies

Tomas Tolenis, Stephen E. Swiontek, Akhlesh Lakhtakia, Ramutis Drazdys

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Tungsten-oxide thin films of three different morphologies-dense, columnar, and chiral-were fabricated by evaporation at low pressure. The morphologies were observed using a scanning-electron microscope and their optical transmission spectrums were also recorded. The CTF discriminated between normally incident light of different linear polarization states. The chiral STF exhibited the circular Bragg phenomenon. Annealing blue-shifted and widened the circular Bragg regime.

Original languageEnglish (US)
Title of host publicationNanostructured Thin Films VII
EditorsAkhlesh Lakhtakia, Tom G. Mackay, Motofumi Suzuki
PublisherSPIE
ISBN (Electronic)9781628411997
DOIs
StatePublished - Jan 1 2014
EventNanostructured Thin Films VII - San Diego, United States
Duration: Aug 20 2014Aug 21 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9172
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherNanostructured Thin Films VII
CountryUnited States
CitySan Diego
Period8/20/148/21/14

Fingerprint

tungsten oxides
Oxide films
Oxides
Tungsten
Thin Films
Thin films
Scanning Electron Microscope
thin films
Light transmission
Evaporation
linear polarization
Annealing
Polarization
Electron microscopes
low pressure
electron microscopes
evaporation
Scanning
annealing
scanning

All Science Journal Classification (ASJC) codes

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Tolenis, T., Swiontek, S. E., Lakhtakia, A., & Drazdys, R. (2014). Tungsten-oxide thin films of dense, columnar, and chiral morphologies. In A. Lakhtakia, T. G. Mackay, & M. Suzuki (Eds.), Nanostructured Thin Films VII [91720X] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9172). SPIE. https://doi.org/10.1117/12.2061605
Tolenis, Tomas ; Swiontek, Stephen E. ; Lakhtakia, Akhlesh ; Drazdys, Ramutis. / Tungsten-oxide thin films of dense, columnar, and chiral morphologies. Nanostructured Thin Films VII. editor / Akhlesh Lakhtakia ; Tom G. Mackay ; Motofumi Suzuki. SPIE, 2014. (Proceedings of SPIE - The International Society for Optical Engineering).
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abstract = "Tungsten-oxide thin films of three different morphologies-dense, columnar, and chiral-were fabricated by evaporation at low pressure. The morphologies were observed using a scanning-electron microscope and their optical transmission spectrums were also recorded. The CTF discriminated between normally incident light of different linear polarization states. The chiral STF exhibited the circular Bragg phenomenon. Annealing blue-shifted and widened the circular Bragg regime.",
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Tolenis, T, Swiontek, SE, Lakhtakia, A & Drazdys, R 2014, Tungsten-oxide thin films of dense, columnar, and chiral morphologies. in A Lakhtakia, TG Mackay & M Suzuki (eds), Nanostructured Thin Films VII., 91720X, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9172, SPIE, Nanostructured Thin Films VII, San Diego, United States, 8/20/14. https://doi.org/10.1117/12.2061605

Tungsten-oxide thin films of dense, columnar, and chiral morphologies. / Tolenis, Tomas; Swiontek, Stephen E.; Lakhtakia, Akhlesh; Drazdys, Ramutis.

Nanostructured Thin Films VII. ed. / Akhlesh Lakhtakia; Tom G. Mackay; Motofumi Suzuki. SPIE, 2014. 91720X (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9172).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Tolenis T, Swiontek SE, Lakhtakia A, Drazdys R. Tungsten-oxide thin films of dense, columnar, and chiral morphologies. In Lakhtakia A, Mackay TG, Suzuki M, editors, Nanostructured Thin Films VII. SPIE. 2014. 91720X. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2061605