Abstract
Two-step Gram-Schmidt downdating methods were proposed for the the QR factorization. It showed that it is important that Gram-Schmidt procedures recover both the residual r and solution f. The vector f must be used in the downdating process to maintain good backward error in the new factorization. The new algorithms were proposed based on this observation.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 273-284 |
| Number of pages | 12 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4474 |
| DOIs | |
| State | Published - Jan 1 2001 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Cite this
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Two-step Gram-Schmidt downdating methods. / Barlow, Jesse Louis; Smoktunowicz, Alicja; Erbay, Hasan.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4474, 01.01.2001, p. 273-284.Research output: Contribution to journal › Article
TY - JOUR
T1 - Two-step Gram-Schmidt downdating methods
AU - Barlow, Jesse Louis
AU - Smoktunowicz, Alicja
AU - Erbay, Hasan
PY - 2001/1/1
Y1 - 2001/1/1
N2 - Two-step Gram-Schmidt downdating methods were proposed for the the QR factorization. It showed that it is important that Gram-Schmidt procedures recover both the residual r and solution f. The vector f must be used in the downdating process to maintain good backward error in the new factorization. The new algorithms were proposed based on this observation.
AB - Two-step Gram-Schmidt downdating methods were proposed for the the QR factorization. It showed that it is important that Gram-Schmidt procedures recover both the residual r and solution f. The vector f must be used in the downdating process to maintain good backward error in the new factorization. The new algorithms were proposed based on this observation.
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UR - http://www.scopus.com/inward/citedby.url?scp=0035763188&partnerID=8YFLogxK
U2 - 10.1117/12.448659
DO - 10.1117/12.448659
M3 - Article
VL - 4474
SP - 273
EP - 284
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
ER -