Ultrasonic feature based imaging for post factum control

J. L. Rose, K. Balasubramaniam, G. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This work focuses on the ultrasonic feature-mapping technique for post-factum control. Feature-based analysis and material state imaging constitute a powerful technique, applying both physically and statistically based principles. The technique integrates many data collection procedures, such as critical angles, surface waves, plate waves, and backscattering techniques, into an extremely versatile data acquisition protocol and entails detailed analysis through state-of-the-technology signal processing, pattern recognition, and system and/or artificial intelligence implementation practice. The various existing possibilities for physically based data collection and the types of feature domains and features available for anomaly representation in materials are discussed. Possible applications of feature-based imaging in a manufacturing environment through post-factum quality control are considered.

Original languageEnglish (US)
Title of host publicationProc 5 IEEE Int Symp Intell Control 90
PublisherPubl by IEEE
Pages1255-1260
Number of pages6
ISBN (Print)0818621087
StatePublished - Dec 1 1990
EventProceedings of the 5th IEEE International Symposium on Intelligent Control 1990 - Philadelphia, PA, USA
Duration: Sep 5 1990Sep 7 1990

Publication series

NameProc 5 IEEE Int Symp Intell Control 90

Other

OtherProceedings of the 5th IEEE International Symposium on Intelligent Control 1990
CityPhiladelphia, PA, USA
Period9/5/909/7/90

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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