ULTRASONIC SIGNAL-PROCESSING CONCEPTS FOR MEASURING THE THICKNESS OF THIN LAYERS.

Joseph Lawrence Rose; Paul A. Meyer

ULTRASONIC SIGNAL-PROCESSING CONCEPTS FOR MEASURING THE THICKNESS OF THIN LAYERS.

Joseph Lawrence Rose, Paul A. Meyer

Research output: Contribution to specialist publication › Article

Abstract

A systematic approach is presented for developing ultrasonic signal-processing procedures that can be used to measure the thickness of thin layers. Such preprocessing procedures as time between echoes, peak-to-peak amplitude analysis, and Fourier transform techniques are considered in the paper. The work can be extended to such areas of study as the property evaluation of thin planar defects in metals, flaw characterization analysis in an adhesively bonded system, and also applied to the fatigue crack analysis problem, including an evaluation of possible corrosion and sealer properties in the thin layer.

Original language	English (US)
Volume	32
No	12
Specialist publication	Materials Evaluation
State	Published - Jan 1 1974

All Science Journal Classification (ASJC) codes

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

Access to Document

Fingerprint Dive into the research topics of 'ULTRASONIC SIGNAL-PROCESSING CONCEPTS FOR MEASURING THE THICKNESS OF THIN LAYERS.'. Together they form a unique fingerprint.

Cite this

@misc{42920356320c4c51b366da95bb7a120a,

title = "ULTRASONIC SIGNAL-PROCESSING CONCEPTS FOR MEASURING THE THICKNESS OF THIN LAYERS.",

abstract = "A systematic approach is presented for developing ultrasonic signal-processing procedures that can be used to measure the thickness of thin layers. Such preprocessing procedures as time between echoes, peak-to-peak amplitude analysis, and Fourier transform techniques are considered in the paper. The work can be extended to such areas of study as the property evaluation of thin planar defects in metals, flaw characterization analysis in an adhesively bonded system, and also applied to the fatigue crack analysis problem, including an evaluation of possible corrosion and sealer properties in the thin layer.",

author = "Rose, {Joseph Lawrence} and Meyer, {Paul A.}",

year = "1974",

month = jan,

day = "1",

language = "English (US)",

volume = "32",

journal = "Materials Evaluation",

issn = "0025-5327",

publisher = "American Society for Nondestructive Testing",

}

TY - GEN

T1 - ULTRASONIC SIGNAL-PROCESSING CONCEPTS FOR MEASURING THE THICKNESS OF THIN LAYERS.

AU - Rose, Joseph Lawrence

AU - Meyer, Paul A.

PY - 1974/1/1

Y1 - 1974/1/1

N2 - A systematic approach is presented for developing ultrasonic signal-processing procedures that can be used to measure the thickness of thin layers. Such preprocessing procedures as time between echoes, peak-to-peak amplitude analysis, and Fourier transform techniques are considered in the paper. The work can be extended to such areas of study as the property evaluation of thin planar defects in metals, flaw characterization analysis in an adhesively bonded system, and also applied to the fatigue crack analysis problem, including an evaluation of possible corrosion and sealer properties in the thin layer.

AB - A systematic approach is presented for developing ultrasonic signal-processing procedures that can be used to measure the thickness of thin layers. Such preprocessing procedures as time between echoes, peak-to-peak amplitude analysis, and Fourier transform techniques are considered in the paper. The work can be extended to such areas of study as the property evaluation of thin planar defects in metals, flaw characterization analysis in an adhesively bonded system, and also applied to the fatigue crack analysis problem, including an evaluation of possible corrosion and sealer properties in the thin layer.

UR - http://www.scopus.com/inward/record.url?scp=0016329092&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0016329092&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0016329092

VL - 32

JO - Materials Evaluation

JF - Materials Evaluation

SN - 0025-5327

ER -