Ultrastructure of a metal/superconductor interface revealed by atomic-resolution STEM techniques

Y. Xin, L. F. Allard, Zhiqiang Mao

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1388-1389
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008

All Science Journal Classification (ASJC) codes

  • Instrumentation

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