Unexpected significant increase in bulk conductivity of a dielectric arising from charge injection

Jian Jun Wang, Thorsten J.M. Bayer, Rui Wang, Jared J. Carter, Clive A. Randall, Long Qing Chen

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Charge injection is a common phenomenon in heterostructures or devices containing metal-insulator interfaces under a voltage bias ranging from dielectric capacitors to electroluminescent and lasing devices. It is generally believed that charge injection only significantly increases the conductivity near the interfacial region or in capacitors with very thin dielectric layers. In this work, the impact of charge injection on bulk conductivity of a 0.5 mm thick Fe-doped SrTiO3 single crystal is investigated with a combination of experimental impedance measurements and computational modelling. It is found that the interfacial charge injection may increase the predicted bulk conductivity of a dielectric by more than one order of magnitude as a consequence of Schottky barrier height lowering.

Original languageEnglish (US)
Article number262902
JournalApplied Physics Letters
Volume110
Issue number26
DOIs
StatePublished - Jun 26 2017

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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