Magnetic force microscopy (MFM) studies of epitaxial MnAs films on GaAs(001) have been performed as a function of the applied magnetic field and the sample temperature. For this purpose, we combined a stable variable-temperature sample stage with a compact magnet assembly to fit a commercial magnetic force microscope. In order to keep the thermal drift that affects MFM measurements low, we employed a permanent magnet that can be rotated in a yoke assembly guiding the magnetic flux to the sample.
|Original language||English (US)|
|Number of pages||4|
|Journal||Applied Physics A: Materials Science and Processing|
|State||Published - Nov 1 2005|
All Science Journal Classification (ASJC) codes
- Materials Science(all)