Studies were conducted during a 2-yr period measuring corn silage and grain yield and velvetleaf seed production in response to velvetleaf density. Velvetleaf densities of 0, 2, 5, 10, and 21 plants/m 2 were established in conventionally tilled corn. The percent corn yield reduction in response to velvetleaf density was similar for both years despite differences in total corn yield. Corn grain and silage yield responded differently to velvetleaf interference. Although both were adversely affected, silage yield reductions were twice that of grain at the low velvetleaf densities. A hyperbolic yield model predicted a maximum yield loss for corn silage and grain of 36 and 37% with incremental losses of 7 and 3%, respectively, as velvetleaf density increased. Velvetleaf seed production ranged from 2,256 to 4,844 seed/m2 from the lowest to the highest density. This study demonstrates that corn silage yield is more sensitive than corn grain yield to velvetleaf interference, as well as how crop value plays an important role in determining economic thresholds. Finally, this research confirms the prolific nature of velvetleaf and shows that even at low densities, velvetleaf seed production could affect weed control decisions for many seasons to come.
|Original language||English (US)|
|Number of pages||5|
|State||Published - Jul 1 2004|
All Science Journal Classification (ASJC) codes
- Agronomy and Crop Science
- Plant Science