Virtual design and analysis of nanometer-scale sensor and device components

D. W. Brenner, J. D. Schall, J. P. Mewkill, O. A. Shenderova, Susan B. Sinnott

Research output: Contribution to journalArticle

27 Scopus citations

Abstract

Four examples of the application of atomistic modeling to the design and analysis of nanometer-scale device components and sensors are discussed. In the first two examples, semiempirical tight-binding electronic structure calculations are used to characterise the electronic properties of uniaxially-strained and chemically-decorated carbon nanotubules. The results are used to suggest possible designs for nanometer-scale strain gauges, vibration sensors, and Schottky diodes. In the second two examples, that are based on variations of scanning-probe microscopy, atomistic simulations are used to explore whether atomic-force microscopy can be used as a probe of surface stress distributions surrounding nanostructures, and whether chemically-reactive tips can be used to pattern surfaces.

Original languageEnglish (US)
Pages (from-to)137-144
Number of pages8
JournalJBIS - Journal of the British Interplanetary Society
Volume51
Issue number4
StatePublished - Dec 1 1998

All Science Journal Classification (ASJC) codes

  • Aerospace Engineering
  • Space and Planetary Science

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