X-ray CCD calibration for the AXAF CCD Imaging Spectrometer

M. Bautz, M. Pivovaroff, F. Baganoff, T. Isobe, S. Jones, S. Kissel, B. LaMarr, H. Manning, G. Prigozhin, G. Ricker, J. Nousek, C. Grant, K. Nishikida, F. Scholze, R. Thornagel

Research output: Contribution to journalConference article

80 Scopus citations

Abstract

Acquisition of ground calibration data from the AXAF CCD Imaging Spectrometer, one of two focal plane instruments on NASA's Advanced X-ray Astrophysics Facility, was completed in 1997. Here we summarize results of the detector level calibration effort. Our calibration program has included measurements of CCD response to undispersed synchroton radiation, measurements of X-ray Absorption Fine Structure, and of sub-pixel structure in the detector. Errors in the energy scale are at the level of a few tenths of one percent, and detection efficiency errors are no larger than a few percent. We have also obtained new insights into the mechanisms by which the CCD gate structure and channel stops influence the CCD spectral redistribution function.

Original languageEnglish (US)
Pages (from-to)210-224
Number of pages15
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3444
StatePublished - Dec 1 1998
EventProceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions - San Diego, CA, USA
Duration: Jul 19 1998Jul 22 1998

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'X-ray CCD calibration for the AXAF CCD Imaging Spectrometer'. Together they form a unique fingerprint.

  • Cite this

    Bautz, M., Pivovaroff, M., Baganoff, F., Isobe, T., Jones, S., Kissel, S., LaMarr, B., Manning, H., Prigozhin, G., Ricker, G., Nousek, J., Grant, C., Nishikida, K., Scholze, F., & Thornagel, R. (1998). X-ray CCD calibration for the AXAF CCD Imaging Spectrometer. Proceedings of SPIE - The International Society for Optical Engineering, 3444, 210-224.