X-ray diffraction studies on La1.85Sr0.15CuO4 doped with Mg in high doping level

X. S. Wu, Z. Q. Mao, J. Lin, W. M. Chen, X. Jin, G. J. Xu, Y. H. Zhang, F. M. Pan, S. S. Jiang

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


The nominal composition of La1.85Sr0.15Cu1-yMgyO4 superconductors with 0.00≤y≤0.30 are synthesized by the solid state reaction techniques. The structure of these Mg doped samples is characterized by X-ray diffraction studies. The atomic structure parameters are obtained by Rietveld refinements. Some meaningful bond distances are determined according to the refined results. The distance between the two apical oxygen atoms in the CuO6 octahedra changed with the Mg content. The room temperature resistivity for each sample is measured.

Original languageEnglish (US)
Pages (from-to)787-788
Number of pages2
JournalPhysica C: Superconductivity and its applications
Issue numberPART 2
StatePublished - Aug 1997

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'X-ray diffraction studies on La<sub>1.85</sub>Sr<sub>0.15</sub>CuO<sub>4</sub> doped with Mg in high doping level'. Together they form a unique fingerprint.

Cite this