X-ray interferometry: Ultra high resolution astronomy

Webster Cash, Ann Shipley, Randy McEntaffer

Research output: Contribution to journalConference articlepeer-review

9 Scopus citations

Abstract

X-rays have tremendous potential for imaging at the highest angular resolution. The high surface brightness of many x-ray sources will reveal angular scales heretofore thought unreachable. The short wavelengths make instrumentation compact and baselines short. We discuss how practical x-ray interferometers can be built for astronomy using existing technology. We describe the Maxim Pathfinder and Maxim missions which will achieve 100 and 0.1 micro-arcsecond imaging respectively. The science to be tackled with resolution of up to one million times that of HST will be outlined, with emphasis on eventually imaging the event horizon of a black hole.

Original languageEnglish (US)
Pages (from-to)127-135
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4506
DOIs
StatePublished - Dec 1 2001
EventSoft X-Ray and EUV Imaging Systems II - San Diego, United States
Duration: Jul 31 2001Aug 1 2001

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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